Modern (scanning) transmission electron microscopy (S/TEM) tools, like the Talos F200X system at Covalent, are outfitted with technologies that allow analysts to craft an optimum imaging session for the unique needs of each client project. In this webinar event, guest speaker Dr. Jan Ringnalda from Thermo Fisher Scientific will be exploring both basic and advanced analytical methods available on TEM systems. With real world examples, he’ll show you what’s possible and describe how you can optimize your experimental design to maximize the insight gained from TEM data.

This Webinar will Answer:

1. What kind of analytical performance is a modern TEM instrument like the Talos capable of? What is its spatial resolution?
2. How should I choose between Bright Field, Dark Field, and High-angle Annular Dark Field imaging methods? What are their advantages and applications?
3. Why is HAADF commonly misunderstood, and how can I use it most effectively in my analysis?
4. How should I incorporate energy dispersive spectroscopy (EDS) into my TEM analysis?
5. What is selected area electron diffraction (SAED)? Why is it useful, and when do I need it?

TEM gives you more than just images

Unlike conventional light microscopy, transmission electron microscopy can produce images that capture phase information, composition, and even crystal lattice structure and orientation in solid samples. Oftentimes, clients may not realize the depth of insight that TEM can unlock, or may misunderstand the different S/TEM techniques used to probe these features in materials.

In this webinar event, we’re diving into the use cases, advantages, and fundamentals of operation in 5 main methods of imaging and analysis available on many modern-day S/TEM instruments:

• Bright-field (BF) TEM Imaging
• Dark-field (DF) TEM imaging
• High-angle annular dark-field (HAADF) STEM imaging
• Energy dispersive spectroscopy (EDS)
• Electron diffraction and selected-area electron diffraction (SAED)