Particle Analysis
Covalent provides direct and indirect particle size analysis, as well as particle zeta potential measurement to characterize the electrokinetic potential of colloidal dispersions.
Particles play a role in many industries: pharmaceuticals, slurries, polishes, powders, and industrial abrasives; they are even used in quantum dots and battery electrodes. In all these applications, particle analysis supplies key quantitative and qualitative information about the overall particle size distribution and even particle morphology.
7 techniques found in Particle Analysis
+
Add to comparison
Dynamic Light Scattering (DLS)
In Particle Analysis
Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.
+
Add to comparison
Laser Diffraction Particle Size Analysis (PSA)
In Particle Analysis
Particle size analysis (PSA) is an indirect, optical technique used to measure particle size distributions - by equivalent spherical diameter (D10, D50, D90) - in liquid and solid samples.
+
Add to comparison
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging,Particle Analysis
Scanning transmission electron microscopy (STEM) is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. STEM is available on both Covalent's FIB-SEM instruments, as well as our TEM. All Covalent's (S)TEM systems are additionally equipped with fully integrated energy-dispersive x-ray spectrometers (EDS or EDX) to allow correlative elemental composition and mapping analysis.
+
Add to comparison
Surfscan® Particle Counting (Surfscan)
In Analytical Services,Particle Analysis
Particle counting by Surfscan® (“Surfscan”) is an optical, non-contact surface characterization technique designed to accomplish rapid detection of particles and in some cases wafer defects. It is one of the most common ways to quantify the number and size of particles dispersed across the surface of an unpatterned wafer (often called a blanket or monitor wafer).
+
Add to comparison
Thermogravimetric Analysis (TGA)
In Material Property Testing,Particle Analysis
Thermogravimetric analysis (TGA) is used to characterize sample volatility, as well as thermal stability and response.
+
Add to comparison
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging,Particle Analysis
Transmission electron microscopy (TEM) is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. "These are incredible images. Thanks for the preview. It is so satisfying to get definitive answers to our questions!" - Brad Aitchison, Sr. Process Engineer, Redlen Technologies
+
Add to comparison
Zeta Potential
In Material Property Testing,Particle Analysis
Zeta potential measures the strength of net charge on particle and solid surfaces. The higher the magnitude of this potential, the stronger the surface interactions (repulsion and/or attraction) will be when the sample contacts other charged materials.
Techniques Showcase
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
Base Price: $450 per Hour
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Base Price: $500 per Sample
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
Scanning Acoustic Microscopy (SAM)
In Microscopy & Imaging,Failure Analysis
Base Price: $450 per Sample
Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the...
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $450 per Hour
STEM is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. In Covalent's...
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $450 per Sample
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial...
Glow Discharge Optical Emission Spectroscopy (GDOES)
In Analytical Chemistry
Base Price: $375 per Hour
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
In Analytical Services,Analytical Chemistry
please contact us for pricing
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...
Capillary Flow Porometry (Porometry)
In Material Testing
please contact us for pricing
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution.
Porosimetry
In Material Testing
Base Price: $150 per Sample
Gas Adsorption Analysis is used for measuring specific surface area, pore sizes / size distribution, and overall porosity...
Tap Density Analysis
In Material Testing
Base Price: $175 per Sample
Tap Density Analysis provides fast, effective measurements of the bulk density of powders and establishes a quantitative metric...
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
Base Price: $450 per Hour
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
X-ray Computed Tomography (Micro-CT)
In Microscopy & Imaging,X-ray Analysis,Failure Analysis
Base Price: $400 per Hour
X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Base Price: $500 per Sample
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
✕
Comparison link sent successfully
✕
Please use valid email address
✕
You need to have at least 2 techniques to compare
✕
You can select maximum 5 techniques
